Semiconductor reliability. Vol 2
Material type:
TextLanguage: ENG Series: ; Vol 2Publication details: New Jersey Engineering Publishers 1962Description: 400pDDC classification: - 621.3815206 VON
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
GENERAL
|
University of Agricultural Sciences, Dharwad | 621.3815206/VON | 1 | Available | 44791 |
William H. Von Alven: Semiconductor reliability. Vol 2. New Jersey. Engineering Publishers, 1962.--(621.3815206VON)
ENGLISH
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