TY  - BOOK
AU  - William H. Von Alven
TI  - Semiconductor reliability. Vol 2 
U1  - 621.3815206 
PY  - 1962///
CY  - New Jersey
PB  - Engineering Publishers
N1  - William H. Von Alven: Semiconductor reliability. Vol 2.  New Jersey.  Engineering Publishers, 1962.--(621.3815206VON)
ER  -