Laxmi C. Patil <br/><br/>
Genetic analysis of spot blotch resistance, yield and yield attributing traits through interspecific (triticum dicoccum (Schrank 

 - Ph.D 
 - Dharwad  University of Agricultural Sciences  2010 
 - 182p 
<br/><br/><br/>ENGLISH 
<br/><br/><label>Dewey Class. No.: </label>630  / PAT