| 000 | 00556nam a2200181Ia 4500 | ||
|---|---|---|---|
| 005 | 20241120165404.0 | ||
| 008 | 241119s9999||||xx |||||||||||||| ||und|| | ||
| 041 | _aENG | ||
| 082 |
_a621.3815206 _bVON |
||
| 100 | _aWilliam H. Von Alven | ||
| 245 | 0 | _aSemiconductor reliability. Vol 2 | |
| 260 |
_aNew Jersey _bEngineering Publishers _c1962 |
||
| 300 | _a400p | ||
| 490 | _vVol 2 | ||
| 504 | _aWilliam H. Von Alven: Semiconductor reliability. Vol 2. New Jersey. Engineering Publishers, 1962.--(621.3815206VON) | ||
| 546 | _aENGLISH | ||
| 942 | _cBK | ||
| 999 |
_c17443 _d17443 |
||